| 1 | | T311-TMXU |
2018G501; 2020G585; 2022G503
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Three-dimensional distribution and propagation of dislocations in β-Ga2O3 revealed by Borrmann effect X-ray topography
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Journal of Applied Physics
|
2023
|
134
|
155104-1
|
| 2 | | 0P5Z-VVKX |
2020G585; 2022G503
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Lattice misorientation at domain boundaries in β-Ga2O3 single-crystal substrates observed via synchrotron radiation X-ray diffraction imaging and X-ray reticulography
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Journal of the American Ceramic Society
|
2023
|
|
1
|
| 3 | | 0ECB-VHAB |
2018G501; 2020G585
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
X-ray topographic observation of dislocations in β-Ga2O3 Schottky barrier diodes and their glide and multiplication under reverse bias
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Scripta Materialia
|
2023
|
226
|
115216-1
|
| 4 | | MUAS-KWN5 |
|
3C, 20B
|
Structural characterization of defects in EFG- and HVPE-grown β-Ga2O3 crystals
|
Osamu Ueda
|
英語 / English
|
Japanese Journal of Applied Physics
|
2022
|
61
|
|
| 5 | | BB50-XPXF |
2017G098; 2018G607; 2019G522; 2021PF-S001
|
14B/14B; 3C/ 3C; 3C/ 3C; 14B/14B; 14B/14B; 3C/ 3C; 14B/14B
|
X-ray zooming optics for analyzer-based multi-contrast computed tomography
|
平野 馨一/Keiichi HIRANO
|
英語 / English
|
Journal of Synchrotron Radiation
|
2022
|
29
|
787
|
| 6 | | 0FB9-36CS |
2016G133; 2018G117
|
3C/ 3C; 20B/20B; 20B/20B; 3C/ 3C
|
Mechanical properties and dislocation dynamics in \beta-Ga_2O_3
|
山口 博隆/Hirotaka YAMAGUCHI
|
英語 / English
|
Japanese Journal of Applied Physics
|
2022
|
61
|
|
| 7 | | M645-N57U |
2020G585
|
3C/ 3C
|
Domain boundaries in ScAlMgO4 single crystal observed by synchrotron radiation X-ray topography and reticulography
|
姚 永昭/Yongzhao YAO; 平野 馨一/ Keiichi Hirano
|
英語 / English
|
Semiconductor Science and Technology
|
2022
|
37
|
115009-1
|
| 8 | | 4R68-A7ZM |
2020G585
|
3C/ 3C; 14B/14B
|
Observation of dislocations in thick β-Ga2O3 single-crystal substrates using Borrmann effect synchrotron X-ray topography
|
姚 永昭/Yongzhao YAO; 平野 馨一/Keiichi Hirano
|
英語 / English
|
APL Materials
|
2022
|
10
|
1
|
| 9 | | VU02-RM7K |
2020G585
|
3C/ 3C; 14B/14B
|
A synchrotron X-ray topography study of crystallographic defects in ScAlMgO4 single crystals
|
姚 永昭/Yongzhao YAO; 平野馨一/Keiichi HIRANO
|
英語 / English
|
Journal of Alloys and Compounds
|
2022
|
896
|
1
|
| 10 | | FZAX-MX8H |
2019G-093
|
3C
|
Uniformity evaluation of lattice spacing of silicon crystals for the realization of the kilogram
|
Atsushi Waseda
|
英語 / English
|
Measurement: Sensors
|
2021
|
18
|
|
| 11 | | XKGK-4283 |
2018G501; 2020G585
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Visualization of the curving of crystal planes in β-Ga2O3 by X-ray topography
|
姚 永昭/Yongzhao YAO; 平野馨一/Keiichi HIRANO
|
英語 / English
|
Journal of Crystal Growth
|
2021
|
576
|
126376-1
|
| 12 | | KTZZ-T4AA |
2016G567; 2018G501; 2020G585
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
X-ray topography of crystallographic defects in wide-bandgap semiconductors using a high-resolution digital camera / X-ray topography of crystallographic defects in wide-bandgap semiconductors using a high-resolution digital camera
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Japanese Journal of Applied Physics
|
2021
|
60
|
010908-1
|
| 13 | | AV1D-GMV2 |
2019G092
|
3C
|
Uniformity Characterization of Lattice Spacing of 28Si Single Crystals
|
Waseda, Atsushi
|
英語 / English
|
Conference on Precision Electromagnetic Measurements
|
2020
|
2020-August
|
|
| 14 | | 5TGR-737B |
2016G567, 2018G501, 2020G585
|
3C, 14B
|
Slip planes in monoclinic β-Ga2O3 revealed from its {010} face via synchrotron X-ray diffraction and X-ray topography
|
Yongzhao Yao
|
英語 / English
|
Japanese Journal of Applied Physics
|
2020
|
59
|
|
| 15 | | 7XK1-HPPY |
2016G133; 2018G117
|
20B/20B; 3C/ 3C; 20B/20B; 3C/ 3C
|
Subsurface-damaged layer in (010)-oriented β -Ga2O3 substrate
|
山口 博隆/Hirotaka YAMAGUCHI; Shinya Watanabe
|
英語 / English
|
Japanese Journal of Applied Physics
|
2020
|
59
|
|
| 16 | | HZCW-T46W |
2016S2-003
|
3C/ 3C
|
High-efficiency ultra-precision comparator for d-spacing mapping measurement of silicon
|
YANG JunLiang/JunLiang YANG; ZHANG Xiaowei/Xiaowei ZHANG; 早稲田 篤/Atsushi WASEDA; 藤本 弘之/Hiroyuki FUJIMOTO
|
英語 / English
|
Journal of Synchrotron Radiation
|
2020
|
27
|
577
|
| 17 | | NZCS-DND5 |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Study of dislocations in AlN singlecrystal using bright-field synchrotron xray topography under a multiple-beam diffraction condition
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Applied Physics Letters
|
2020
|
117
|
092102-1
|
| 18 | | KF9Z-SH67 |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Dislocation classification of a large-area β-Ga2O3 single crystal via contrast analysis of affine-transformed X-ray topographs
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Journal of Crystal Growth
|
2020
|
548
|
125825-1
|
| 19 | | 9CYJ-X77K |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Identification of Burgers vectors of dislocations in monoclinic β-Ga2O3 via synchrotron X-ray topography
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Journal of Applied Physics
|
2020
|
127
|
205110-1
|
| 20 | | SUHM-VVCM |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Crystallinity Evaluation and Dislocation Observation for an Aluminum Nitride Single-Crystal Substrate on a Wafer Scale / Crystallinity Evaluation and Dislocation Observation for an Aluminum Nitride Single-Crystal Substrate on a Wafer Scale
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Journal of Electronic Materials
|
2020
|
49
|
5144
|
| 21 | | 3SK2-8WP3 |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Observation of dislocations in β-Ga2O3 single-crystal substrates by synchrotron X-ray topography, chemical etching, and transmission electron microscopy / Observation of dislocations in β-Ga2O3 single-crystal substrates by synchrotron X-ray topography, chemical etching, and transmission electron microscopy
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Japanese Journal of Applied Physics
|
2020
|
59
|
045502-1
|
| 22 | | R45S-SN82 |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
Revelation of dislocations in β-Ga2O3 substrates grown by edge-defined film-fed growth / Revelation of dislocations in β-Ga2O3 substrates grown by edge-defined film-fed growth
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Physica Status Solidi A
|
2020
|
217
|
|
| 23 | | CZFE-3XNA |
2008G092, 2010G104, 2013G080
|
3C, 12C, NW10A
|
Facilitated Dehydration of Rb + Ions in Cation-Exchange Resin when Surrounded by Cs + Ions: A Marked Phenomenon in Superheated Water
|
Harada, Makoto
|
英語 / English
|
ChemistrySelect
|
2019
|
4
|
4718
|
| 24 | | NY54-Y8TP |
2016S2-003
|
3C/ 3C
|
Improvement of the self-referenced lattice comparator: From using a pencil beam to a brush beam
|
YANG JunLiang/JunLiang YANG
|
英語 / English
|
AIP Conference Proceedings
|
2019
|
2054
|
|
| 25 | | HV2U-J7FK |
2016G567; 2018G501
|
3C/ 3C; 14B/14B; 3C/ 3C; 14B/14B
|
X-ray diffraction and Raman characterization of β-Ga2O3 single crystal grown by edge-defined film-fed growth method / X-ray diffraction and Raman characterization of β-Ga2O3 single crystal grown by edge-defined film-fed growth method
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Journal of Applied Physics
|
2019
|
126
|
205106-1
|
| 26 | | ZY80-EK4U |
2018G501
|
3C/ 3C; 14B/14B
|
Observation of dislocations and their arrays in PVT-grown AlN single crystal substrate by synchrotron X-ray topography
|
姚 永昭/Yongzhao YAO
|
英語 / English
|
Japanese Journal of Applied Physics
|
2019
|
58
|
SCCB29-1
|
| 27 | | HJ7T-B16E |
2014G142; 2016G133
|
3C/ 3C; 20B/20B; 3C/ 3C; 20B/20B
|
Stacking faults in $\beta$-Ga$_{2}$O$_{3}$ crystals observed by X-ray topography
|
山口 博隆/Hirotaka YAMAGUCHI; 倉又朗人
|
英語 / English
|
Journal of Applied Crystallography
|
2018
|
51
|
1372
|
| 28 | | JGM5-M930 |
2018G641
|
3C/ 3C
|
3D observation of quasicrystal alloy using X-ray differential phase-contrast microscope with a zone plate
|
渡辺 紀生/Norio WATANABE; Sadao Aoki
|
英語 / English
|
Microscopy and Microanalysis
|
2018
|
24
|
166
|
| 29 | | MNGB-A88U |
2015C303
|
3C/ 3C
|
Observation of threading dislocations in ammono-thermal gallium nitride single crystal by using synchrotron X-ray topography
|
姚 永昭/Yongzhao YAO; 石川由加里/Yukari ISHIKAWA; 菅原 義弘/Yoshihiro SUGAWARA; 高橋由美子/Yumiko TAKAHASHI; 平野 馨一/Keiichi HIRANO
|
英語 / English
|
Journal of Electronic Materials
|
2018
|
47
|
5007
|
| 30 | | KTAV-J453 |
|
3C3
|
Spin density in YTiO 3 : I. Joint refinement of polarized neutron diffraction and magnetic x-ray diffraction data leading to insights into orbital ordering
|
I. A. Kibalin
|
英語 / English
|
PHYSICAL REVIEW B
|
2017
|
|
|
| 31 | | 7KPM-CKJ8 |
2016G567
|
3C/ 3C; 14B/14B
|
Elementary Screw and Mixed-Type Dislocations in 4H-SiC Characterized by X-Ray Topography Taken with Six Equivalent 11-28 g-Vectors and a Comparison to Etch Pit Evaluation
|
姚 永昭/Yongzhao YAO; 石川由加里/Yukari ISHIKAWA; 菅原 義弘/Yoshihiro SUGAWARA; 高橋 由美子/Yumiko TAKAHASHI; 平野馨一/Keiichi HIRANO
|
英語 / English
|
Materials Science Forum
|
2017
|
897
|
185
|
| 32 | | MGZ1-VSG8 |
2016S2-003
|
3C/ 3C
|
A new 28Si single crystal: counting the atoms for the new kilogram definition
|
G. Bartl; P. Becker; B. Beckhoff; H. Bettin; E. Beyer; M. Borys; I. Busch; L. Cibik; G. D'Agostino; E. Darlatt; M. Di Luzio; Kenichi FUJII; 藤本 弘之/Hiroyuki FUJIMOTO; K. Fujita; M. Kolbe; M. Krumrey; Naoki KURAMOTO; E. Massa; M. Mecke; S. Mizushima; M. M?ller; T. Narukawa; A. Nicolaus; A. Pramann; D. Rauch; O. Rienitz; C. P. Sasso; A. Stopic; R. Stosch; 早稲田 篤/Atsushi WASEDA; S. Wundrack; L. Zhang; ZHANG Xaowei/Xiaowei ZHANG
|
英語 / English
|
Metrologia
|
2017
|
54
|
693
|
| 33 | | MKX8-FPU0 |
2012S2-004; 2016S2-003
|
3C/ 3C; 3C/ 3C
|
Uniformity Evaluation of Lattice Spacing of 28Si Single Crystals
|
早稲田 篤/Atsushi WASEDA; 藤本 弘之/Hiroyuki FUJIMOTO; ZHANG Xaowei/Xiaowei ZHANG; Naoki KURAMOTO; Kenichi FUJII
|
英語 / English
|
IEEE Transactions on Instrumentation and Measurement
|
2017
|
66
|
1304
|
| 34 | | NWVY-96R2 |
2013G054; 2014G021
|
3C/ 3C; 14B/14B; 14B/14B
|
Development and application of variable-magnification x-ray Bragg optics
|
平野 馨一/Keiichi HIRANO; Yoshiki YAMASHITA; Yumiko TAKAHASHI; Hiroshi SUGIYAMA
|
英語 / English
|
AIP Conference Proceedings
|
2016
|
1741
|
040020-1
|
| 35 | | T09D-2NAN |
2014G142
|
3C/ 3C; 20B/20B
|
Slip system analysis and X-ray topographic study on $\beta$-Ga$_2$O$_3$
|
山口 博隆/Hirotaka YAMAGUCHI; 倉又朗人 / Akin Kuramata; 増井建和 / Takekazu Masui
|
英語 / English
|
Superlattices and Microstructures
|
2016
|
99
|
99
|
| 36 | | 38SS-7NKH |
2014G684
|
3C/ 3C
|
Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter
|
渡辺 紀生/Norio WATANABE; 円谷 雄二/Yuji TSUBURAYA; 島田 晃広/Akihiro SHIMADA; 青木 貞雄/Sadao AOKI
|
英語 / English
|
AIP Conference Proceedings
|
2016
|
1696
|
|
| 37 | | ZB72-XTZU |
2015C303
|
3C/ 3C
|
Dislocations in SiC revealed by NaOH vapor etching and a comparison with X-ray topography taken with various g-vectors
|
姚 永昭/Yongzhao YAO; 石川由加里/Yukari ISHIKAWA; 菅原 義弘/Yoshihiro SUGAWARA; 佐藤功二/Koji SATO
|
英語 / English
|
Materials Science Forum
|
2016
|
858
|
389
|
| 38 | | SR6W-U13V |
2012G643
|
3C/ 3C
|
First Observation of Non-resonant X-ray Magnetic Diffraction for Multilayers
|
下山 秀文/Hidefumi SHIMOYAMA; 大沢 冬樹子/Tokiko OOSAWA; 渡邉 啓海/Hiromi WATANABE; 鈴木 宏輔/Kosuke SUZUKI; 櫻井 浩; 櫻井 浩; 伊藤 正久/Masahisa ITO
|
英語 / English
|
Key Engineering Materials
|
2016
|
698
|
3
|
| 39 | | HJ8F-JRHV |
|
3C
|
Resonance effect in white X-ray magnetic diffraction of GdAl$_{2}$
|
Hiromichi ADACHI, Hiroshi KAWATA, M. Ito
|
英語 / English
|
Journal of Applied Crystallography (J. Appl. Crystallogr.)
|
2015
|
|
|
| 40 | | NTHF-2SF2 |
2013G054, 2014G021
|
3C, 14B
|
Development of Variable-Magnification X-Ray Bragg Optics
|
K. Hirano, Y. Yamashita, Y. Takahashi and H. Sugiyama
|
英語 / English
|
Journal of Synchrotron Radiation
|
2015
|
22
|
956
|
| 41 | | 7J6B-N9WB |
2012S2004
|
3C
|
Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals
|
A. Waseda, H. Fujimoto, X. W. Zhang, N. Kuramoto, and K. Fujii
|
英語 / English
|
IEEE Transactions on Instrumentation and Measurement
|
2015
|
64
|
1692
|
| 42 | | 1N55-HSTS |
2012S2004
|
3C
|
Improved Measurement Results for the Avogadro Constant using a 28Si-Enriched Crystal
|
Y. Azuma, P. Barat, G. Bartl, H. Bettin, M. Borys, I. Busch, L. Cibik, G. DAgostino, K. Fujii, H. Fujimoto, A. Hioki, M. Krumrey, U. Kuetgens, N. Kuramoto, G. Mana, E. Massa, R. Mee$\beta$, S. Mizushima, T. Narukawa, A. Nicolaus, A. Pramann, S. A. Rabb, O. Rienitz, C. Sasso, M. Stock, R. D. Vocke. Jr, A. Waseda, S. Wundrack and S. Zakel
|
英語 / English
|
Metrologia
|
2015
|
52
|
360
|
| 43 | | 2JVT-E43K |
2012G643; 2014G594
|
3C/ 3C; 3C/ 3C
|
Performance of A Two-Dimensional Area Detector for X-Ray Magnetic Diffraction Experiments of Multilayers
|
大沢 冬樹子/Tokiko OOSAWA; 鈴木 宏輔/Kosuke SUZUKI; 伊藤 正久/Masahisa ITO
|
英語 / English
|
Proceedings of The 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications and 7th International Conference on Advanced Micro-Device Engineering
|
2015
|
|
228
|
| 44 | | DS84-E37K |
2012S2-004
|
3C
|
Homogeneity characterization of lattice spacing of silicon single crystals
|
A Waseda, H Fujimoto, Xiaowei ZHANG, N Kuramoto, K Fujii
|
英語 / English
|
Conference on Precision Electromagnetic Measurements
|
2014
|
|
|
| 45 | | UEC2-YFVV |
2013G172, 2011G247
|
3C, 15C, 20B
|
Different Behavior of Threading Edge Dislocation Conversion During the Solution Growth of 4H---SiC Depending on the Burgers Vector
|
S. Harada, Y. Yamamoto, K. Seki, A. Horio, M. Tagawa and T. Ujihara
|
英語 / English
|
Acta Materialia
|
2014
|
81
|
284
|
| 46 | | EXPH-SEP7 |
2013G172, 2011G247
|
3C, 15C, 20B
|
Low-Dislocation-Density 4H-SiC Crystal Growth utilizing Dislocation Conversion during Solution Method
|
Y. Yamamoto, S. Harada, K. Seki, A. Horio, T. Mitsuhashi, D. Koike, M. Tagawa, and T. Ujihara
|
英語 / English
|
Applied Physics Express
|
2014
|
7
|
065501
|
| 47 | | 2XDM-755V |
2013G172
|
15C, 3C, 20B
|
Surface Morphology and Threading Dislocation Conversion Behavior during Solution Growth of 4H-SiC using Al-Si Solvent
|
S. Harada, Y. Yamamoto, S. Xiao, M. Tagawa and T. Ujihara
|
英語 / English
|
Materials Science Forum
|
2014
|
778-780
|
67
|
| 48 | | GCTW-6TFP |
2010G674, 2012G698
|
3C
|
Development of X-Ray Differential Phase-Contrast Microscope using a Scanning Edge Filter and its Application to Phase Tomography
|
N. Watanabe
|
日本語 / Japanese
|
X線結像光学ニューズレター / X-ray Imaging Optics Newsletter
|
2014
|
39
|
1
|
| 49 | | GBBU-1JCN |
2006G046, 2008G190
|
3C
|
A study of Magnetic Moments of CeRh$_{3}$B$_{2}$ by X-Ray Magnetic Diffraction Experiments
|
M. Ito, K. Suzuki, T. Tadenuma, R. Nagayasu, Y. Sakurai, Y. Onuki, E. Nishibori and M. Sakata
|
英語 / English
|
Journal of Physics: Conference Series
|
2014
|
502
|
012018
|
| 50 | | S1WD-6KGK |
2012G159
|
3C, 15C, 20B
|
Characterization of the Defect Evolution in Thick Heavily Al-Doped 4H-SiC Epilayers
|
S. Ji, K. Kojima, Y. Ishida, H. Yamaguchi, S. Saito, T. Kato, H. Tsuchida, S. Yoshida and H. Okumura
|
英語 / English
|
Materials Science Forum
|
2014
|
778-780
|
151
|
